Definitive Molecular Level Characterization of Defects in UiO-66 Crystals.

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Definitive Molecular Level Characterization of Defects in UiO-66 Crystals.

Sep 10, 2015
Angewandte Chemie (International Ed. In English)

Trickett CA, Gagnon KJ, Lee S, Gándara F, Bürgi HB, Yaghi OM

The identification and characterization of defects, on the molecular level, in metal-organic frameworks (MOFs) remain a challenge. With the extensive use of single-crystal X-ray diffraction (SXRD), the missing linker defects in the zirconium-based MOF UiO-66, Zr6 O4 (OH)4 (C8 H4 O4 )6 , have been identified as water molecules coordinated directly to the zirconium centers. Charge balancing is achieved by hydroxide anions, which are hydrogen bonded within the pores of the framework. Furthermore, the precise nature of the defects and their concentration can be manipulated by altering the starting materials, synthesis conditions, and post-synthetic modifications. © 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

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